Transmission Electron Microscopy (TEM)

Two transmission electron microscopes (TEM) are available at DPM:

JEOL 2000 FX equipped with energy dispersive X-ray analyzer (EDAX) Link AN 10000

JEOL 2200FS HRTEM (high resolution TEM), 200 kV FEG, equipped further with EF-TEM (energy filtering TEM), EELS (electron energy loss spectroscopy by means of in-column filter), EDX, STEM with BF (bright field) and DF (dark field) detectors, HAADF (high angle annular dark field), tomography reconstruction, EDX and EELS (electron energy loss spectroscopy) mapping, precession electron diffraction, heating holder, cryo-holder, nano-tomography holder, and Hysitron in-situ nano-indenter.

Contact: doc. RNDr. Miroslav Cieslar, CSc.